WAFER-COMPATIBELE PLASMA GEFOCUSTE IONENBUNDEL-SCANNING ELEKTRONENMICROSCOOP (PFIB-SEM) SYSTEEM
Estimated value—
DeadlineExpired6 Jul 2026, 11:30
Competition00 participants
Lots11 lot
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Key information
Identifier
Contract type
—
Deadline
6 Jul 2026, 11:30
CPV codes
38000000 - Laboratory, optical and precision equipments (excl. glasses)
Status
Active
Notice type
cn-standardContract or concession notice – standard regime
Source
Estimated value
—
Publication date
3 Jun 2026, 22:00
Overview
WAFER-COMPATIBELE PLASMA GEFOCUSTE IONENBUNDEL-SCANNING ELEKTRONENMICROSCOOP (PFIB-SEM) SYSTEEM
WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM
Lots1
Documentation0
The source system does not support document syncing.
Award criteria0
No procedure-level award criteria recorded.