Supply, delivery, installation Lot 1-300mm Electro-Magneto-Optical Probe Station and Lot 2-Device Parameter analyser for use with 300mm Electro Magneto-Optical Probe stationTyndall National Instit UCC

EF16Contract notice – general directive, standard regime425faf1e-e7f4-481c-b5cb-42f199fa3909UCUniversity College Cork
Estimated value€490,000
DeadlineExpired4 Aug 2026, 11:00
Competition00 participants
Lots22 lots

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Key information

Contract type
Deadline
4 Aug 2026, 11:00
CPV codes
38000000 - Laboratory, optical and precision equipments (excl. glasses)33141641 - Probes38300000 - Measuring instruments38400000 - Instruments for checking physical characteristics38434000 - Analysers
Status
Active
Notice type
EF16Contract notice – general directive, standard regime
Source
Estimated value
€490,000
Publication date
2 Jul 2026, 23:00

Overview

Within the CHIPS-JU NanoIC pilot line Tyndall is developing novel materials for embedded DRAM and 3D integration for future leading-edge integrated circuits. In NanoIC, Tyndall’s flexibility into materials integration will allow for rapid, short-cycle screening to reduce the cycle time in identifying and integrating highly performing materials to carry forward into IC development. Our role is to provide agile wafer scale nanofabrication and processing beyond silicon for the integration of selected new materials – Transition Metal Dichalcogenides (TMDs) and oxide semiconductor (OSC) – and FET device architectures. The NanoIC teams at Tyndall will synthesize thin film TMDs and OSCs and will fabricate and test a wide range of materials and devices. Other activities may include compound semiconductors devices, wide band gap materials, photonic, magnetic or ferroelectric materials. The electrical properties and performance of these materials/devices are of significant importance. Consequently, a multi-function 300mm Electro-Magneto-Optical Probe Station (Lot 1) is required to study the electrical properties of these materials and devices under a range of temperature conditions. The Probe station, in combination with the Device Parameter analyser (Lot 2), will enable users to perform electrical measurements (current voltage both in DC and in pulsed mode) at different temperatures and under magnetic field or illumination as required.

Contracting authorities1

UC

IE-REGISTRATION-NUMBER IE0006286E

ieCork, Ireland
[email protected]

Lots2

Documentation3

3 documents
  • Supply, delivery, installation Lot 1-300mm Electro-Magneto-Optical Probe Station and Lot 2-Device Parameter analyser for use with 300mm Electro Magneto-Optical Probe stationTyndall National Instit UCC (notice).pdf

    PDF document

    2.0 MB
  • c4t_8553247_1.xml

    XML document

    795 B

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