Aquisição de 1 (um) sistema de microscopia duplo de Feixe de Iões Focalizado (FIB) acoplado a Microscópio Eletrónico de Varrimento por emissão de campo (FEG-SEM) para o Laboratório Associado CICECO – Instituto de Materiais de Aveiro
Estimated value€600,000
DeadlineExpired28 Jun 2026, 23:59
Competition00 participants
Lots11 lot
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Key information
Identifier
00370327-2026
Contract type
—
Deadline
28 Jun 2026, 23:59
CPV codes
38511100 - Scanning electron microscopes
Status
Active
Notice type
cn-standardContract or concession notice – standard regime
Source
Estimated value
€600,000
Publication date
28 May 2026, 22:00
Overview
Aquisição de 1 (um) sistema de microscopia duplo de Feixe de Iões Focalizado (FIB) acoplado a Microscópio Eletrónico de Varrimento por emissão de campo (FEG-SEM) para o Laboratório Associado CICECO – Instituto de Materiais de Aveiro
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Timeline
27 May 2026, 13:52
Dispatch date
Milestone
28 May 2026, 22:00
Publication date
Publication
28 May 2026, 23:00
Requested publication date
Milestone
28 Jun 2026, 23:59
Submission deadline
Deadline
Version history
None recorded.
Lots1
Documentation0
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Award criteria0
No procedure-level award criteria recorded.