Facet passivation and coating system (HHI-08) - PR1216551-3220-P

CN-GEN-STDContract notice – general directive, standard regimepr1216551-3220-pFBFraunhofer-Gesellschaft - Einkauf B12
Estimated value
DeadlineExpired3 Jul 2026, 06:00
Competition00 participants
Lots11 lot

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Key information

Identifier
pr1216551-3220-p
Contract type
Deadline
3 Jul 2026, 06:00
CPV codes
42900000 - Miscellaneous general and special-purpose machinery32547000 - Vacuum switchboards
Status
UNKN
Notice type
CN-GEN-STDContract notice – general directive, standard regime
Estimated value
Publication date
23 Jun 2026, 13:06

Overview

Facet passivation and coating system (HHI-08) Facet passivation and coating system (HHI-08)

anyw-cou, Germany

1 Facet passivation and coating syste Das ausgeschriebene System ist für die Abscheidung optischer Funktionsbeschichtungen auf optoelektronischen Halbleiterbauelementen vorgesehen, insbesondere für Antireflexbeschichtungen und die Facettenpassivierung von Hochleistungslasern. Bei Hochleistungslasern können Defekte an der Facettenoberfläche zu lokalen Hotspots und thermischen Schäden führen. Herkömmliche Sputterverfahren arbeiten mit vergleichsweise hohen Ionenenergien, was empfindliche Facettenoberflächen beeinträchtigen kann. Die plasmaunterstützte Abscheidung mittels Elektronenzyklotronresonanz (ECR) ermöglicht eine deutliche Reduzierung der Ionenprallenergie durch die Entkopplung der Plasmagenerierung von der Ionenbeschleunigung, was eine schonende und zuverlässige Beschichtung ermöglicht. Aus diesem Grund ist ein ECR-basiertes Beschichtungssystem für die vorliegende Anwendung zwingend erforderlich. Optionen Extended Warranty Spectral System Measurement range Accuracy - thin films 5-20 nm Accuracy - medium thickness 20-200 nm Optical constants Flip mechanism Cooling water The tendered system is intended for the deposition of optical functional coatings on opto‑electronic semiconductor devices, in particular for anti‑reflection coatings and facet passivation of high‑power laser devices. In high‑power lasers, defects at the facet surface can lead to localized hot spots and thermal damage. Conventional sputtering processes involve comparatively high ion energies, which may adversely affect sensitive facet surfaces. Electron Cyclotron Resonance (ECR) plasma‑assisted deposition enables a significant reduction of ion impact energy by decoupling plasma generation from ion acceleration, allowing gentle and reliable coating. For this reason, an ECR‑based coating system is mandatory for the present application. Optionen Extended Warranty Spectral System Measurement range Accuracy - thin films 5-20 nm Accuracy - medium thickness 20-200 nm Optical constants Flip mechanism Cooling water

anyw-cou, Germany

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Timeline

23 Jun 2026, 00:00

Requested publication date

Publication

23 Jun 2026, 13:06

Issued at

Publication

03 Jul 2026, 06:00

LOT-0000 Participation request reception period

Deadline

Version history

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